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Industrial Defects Discrimination Applying Imaging Spectroscopy and Neural Networks

O.M. Conde, P.B. Garcia-Allende, A.M. Cubillas, D.W. Gonzalez, F.J. Madruga, J.M. López-Higuera

9th ECNDT (European Conference on NDT Conference Proceedings), Berlin, pp , 25/09/2006
 
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