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Relevant Information Extraction from Hyperspectral Images for Quality Control of Industrial Processes

P.B. Garcia-Allende, O.M. Conde, J.Mirapeix, A.M. Cubillas, J.M. Lopez-Higuera

ODIMAP V (5th Topical Meeting on Optoelectronic Distance/Displacement Measurements and Applications), Madrid, Spain, pp 271-276, 02/10/2006
ISBN: 846900938-9
 
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