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Quantitative Characteristics of Subsurface defects using an Automated Absolute Contrast Method

D.A. Gonzalez, C. Ibarra-Castanedo, X. Maldague, F.J. Madruga, J.M. Lopez-Higuera

ODIMAP IV (4th Topical Meeting on Optoelectronic Distance/Displacement Measurement and Applications), Oulu, Finland, pp 352-357, 16/06/2004
ISBN: 9514273680
 
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