Quantitative Characteristics of Subsurface defects using an Automated Absolute Contrast Method

Quantitative Characteristics of Subsurface defects using an Automated Absolute Contrast Method D.A. Gonzalez, C. Ibarra-Castanedo, X. Maldague, F.J. Madruga, J.M. Lopez-Higuera ODIMAP IV (4th Topical Meeting on Optoelectronic Distance/Displacement Measurement and Applications), Oulu, Finland, pp 352-357, 16/06/2004 ISBN: 9514273680