CHARACTERIZATION OF TAPERED, POLISHED OR UNCLADDED SI AND GI POF GEOMETRIES FOR USE IN TAPERS AND MU

CHARACTERIZATION OF TAPERED, POLISHED OR UNCLADDED SI AND GI POF GEOMETRIES FOR USE IN TAPERS AND MULTIPOINT SENSORS J. Arrue, F.Jimenez, M. Lomer, G. Aldabaldetreku, G. Durana, J. Zubia POF'2006 (15th International Conference on Polymer Optical Fiber), Grand Hilton, Seoul, Korea, pp 187-192, 11/09/2006