Industrial Defects Discrimination Applying Imaging Spectroscopy and Neural Networks |
Industrial Defects Discrimination Applying Imaging Spectroscopy and Neural Networks O.M. Conde, P.B. Garcia-Allende, A.M. Cubillas, D.W. Gonzalez, F.J. Madruga, J.M. López-Higuera 9th ECNDT (European Conference on NDT Conference Proceedings), Berlin, pp , 25/09/2006 |