Automatic data processing based on the skewness statistic parameter for subsurface defect detection by active infrared thermography

F.J. Madruga, C. Ibarra-Castanedo, O.M. Conde, J.M. López-Higuera, X. Maldague

Quirt2008, Krakow, Poland, pp. 1-6; 02/07/2008