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CHARACTERIZATION OF TAPERED, POLISHED OR UNCLADDED SI AND GI POF GEOMETRIES FOR USE IN TAPERS AND MU PDF Print E-mail
CHARACTERIZATION OF TAPERED, POLISHED OR UNCLADDED SI AND GI POF GEOMETRIES FOR USE IN TAPERS AND MULTIPOINT SENSORS

J. Arrue, F.Jimenez, M. Lomer, G. Aldabaldetreku, G. Durana, J. Zubia

POF'2006 (15th International Conference on Polymer Optical Fiber), Grand Hilton, Seoul, Korea, pp 187-192, 11/09/2006
 
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