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Inicio arrow Publicaciones arrow Revistas Internacionales arrow Defect detection with CCD-spectrometer and photodiode-based arc-welding...J Mater Process Tech; 2011
Defect detection with CCD-spectrometer and photodiode-based arc-welding...J Mater Process Tech; 2011 PDF Imprimir E-Mail
Defect detection with CCD-spectrometer and photodiode-based arc-welding monitoring systems

J. Mirapeix, R. Ruiz-Lombera, J.J. Valdiande, L. Rodriguez-Cobo, F. Anabitarte and A. Cobo 

Journal of Materials Processing Technology, pp. 2132-2139; ISSN: 0924-0136; 27/07/2011.
Índice de impacto: 1,783, Puesto 4 de 43 en Ingeniería Industrial; Cuartil: 1, Tercil: 1.  
 
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