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Optimized Marks for Qualitative Material Discrimination

O.M. Conde, L. Uriarte, P.B. Garcia-Allende, A.M. Cubillas, J.M. Lopez-Higuera 

IEEE Sensors Conference 2010, Waikoloa, Big Island, Hawai, pp. 1685-1689; ISBN: 978-1-4244-8168-2; 01/11/2010.  
 
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