Optimized Marks for Qualitative Material Discrimination

Optimized Marks for Qualitative Material Discrimination O.M. Conde, L. Uriarte, P.B. Garcia-Allende, A.M. Cubillas, J.M. Lopez-Higuera  IEEE Sensors Conference 2010, Waikoloa, Big Island, Hawai, pp. 1685-1689; ISBN: 978-1-4244-8168-2; 01/11/2010.