Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:On line IC test course with distance access to test equipment
Type:International Conference
Where:2nd IEEE Latin American Test Workshop. Cancún (Mexico)
Date:2001-02
Authors: Miguel Angel Allende
Román Mozuelos
Mar Martínez
Salvador Bracho
R&D Lines: Formation of engineers in design and test techniques for VLSI circuits
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ISBN:
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Abstract:
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