Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Design for Test of High-Speed Folded ADCs
Type:International Conference
Where:XX Conference on Design of Circuits and Integrated Systems(DCIS 2005) Lisboa(P)
Authors: Yolanda Lechuga
Román Mozuelos
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
Projects: Técnicas de Test para Circuitos Mixtos, Analógicos-Digitales. Aplicación ...
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Abstract:This paper presents a design for test approach for folding and interpolated analog-to-digital converters that incorporates a distributed track-and-hold preprocessing. The test approach samples the average voltage of the amplifier differential outputs. By comparing sequentially the sampled voltage of each amplifier with the one of a neighbour cell, the defects on the CUT can be detected. A fault evaluation is done to check the test effectiveness.
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