Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Analog Circuit Test Based in Hypothesis Test of Dynamic Current Consumption
Type:International Conference
Where:International Mixed Signal Testing Workshop. Canada
Date:1996-05
Authors: V. Puente
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
Projects:
ISBN:
PDF File:
Abstract:
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