Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Optimization of a Structural DfT Targeting Fault Detection on High‐Speed ADCs
Type:International Conference
Where:European Test Symposium (ETS'09). Sevilla(E)
Date:2009-05
Authors: Yolanda Lechuga
Román Mozuelos
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
Projects: Métodos de Test Funcionales y Estructurales: Aplicacion al Autotest de Ci...
ISBN:
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Abstract:
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