Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Dynamic Current Testing Methods in Mixed Signal Integrated Circuits
Type:International Conference
Where:Open Workshop AMATIST Project & Final Review Meeting. University of Twente (NL)
Date:1997-05
Authors: Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
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ISBN:
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Abstract:
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