Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Cellular Automata-based Mixed Test Pattern Generator for Built-in Self-test
Type:International Conference
Where:IEEE European Test Workshop (ETW97). Cagliari (Italia)
Date:1997-05
Authors: M. J. López
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
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