Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Model-Driven Analysis of Security, Reliability, Test, Privacy, Safety and Trust of IoE Services
Type:International Conference
Where:Surrealist Workshop of the IEEE European Test Symposium, Bremen, Germany
Date:2018-05
Authors:
R&D Lines: Design and verification of HW/SW embedded systems
Projects: ECSEL 737494-2 MegaMart2
ISBN:
PDF File:see file
Abstract:In this presentation, Model-Driven, electronic system design for the IoE is discussed. Modeling of extra-functional poperties such as Security, Reliability, Test, Privacy, Safety and Trust of IoE Services is described. A single-source approach supported by powerful design tools is proposed. Background results from previous projects are described and its further exploitation through the ECSEL MegaMart project, presented.
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