Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Chances of Supply Current Test Techniques for Mixed Signal Integrated Circuits
Type:International Conference
Where:IEE Systems on a Chip, UCD (Dublín)
Date:1998-09
Authors: J. Argüelles
M. J. López
R&D Lines: Test methods of digital and mixed integrated circuits
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