Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Fault Detection in Switched-current Building-blocks by Dynamic Current Test
Type:International Conference
Where:XIII Design of Circuits and Integrated Systems Conference (DCIS98). Madrid
Date:1998-11
Authors: L. González
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
Projects:
ISBN:84-606-8345-7
PDF File:
Abstract:
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