Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Dynamic Current Test of Switched-current Buildings-blocks
Type:International Conference
Where:IEEE International Mixed Signal test Symposium. Vancouver (Canada)
Date:1999-06
Authors: L. González
D. Pando
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
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ISBN:
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Abstract:
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