| Ficha completa |
| Título: | Test of a Switched Capacitor ADC by a Built-In Charge Sensor |
| Tipo: | Articulo en revista internacional |
| Lugar: | Microelectronics Journal 36 (12): 1064-1072 |
| Fecha: | 2005-11 |
| Autores: |
Román Mozuelos
Yolanda Lechuga
Mar Martínez
Salvador Bracho
|
| Líneas: |
Métodos de test de circuitos integrados digitales y mixtos
|
| Proyectos: |
Técnicas de Test para Circuitos Mixtos, Analógicos-Digitales. Aplicación ...
|
| ISBN: | 0026-2692 |
| Fichero: |
|
| Resumen: | A test methodology for switched capacitor circuits is described. The test approach uses a built-in sensor to analyze the charge transfer inside the circuit under test (CUT). The test methodology is applied to a 10-bit algorithmic analog to digital converter to characterize the static linearity and to obtain the simulated fault coverage figures taking into account a catastrophic fault model. The goodness of the charge sensor has been experimentally evaluated with an SC integrator for fault detection and built-in sensor influence on the CUT performances. |
