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|Analysis of Random Testbench for Data-Dominated Hardware Descriptions
|XII IEEE European Test Symposium
Pablo Pedro Sánchez
|As the latest version of the International Technology Roadmap for Semiconductors highlights, verification has become the dominant cost of the electronic system design process. Although advances in formal methods have improved some aspects of the task, software simulation remains the primary method of functional verification. Traditionally, heuristic coverage metrics have been used to evaluate the simulation-based validation process and the development of coverage-driven random-based test bench generation techniques is allowing the automation of the functional verification process. This coverage-based approach has a very serious disadvantage: the metrics have no formal meaning and so there is no direct correlation between classes of bugs and coverage metrics. The main goal of this paper is to explore methods that provide a formal meaning to coverage metrics with random test benches. They are independent of a particular fault or bug model. The methods are based on polynomial models of the system under verification.