Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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   PUBLICATIONS originated within the project: "Técnicas de Test para Circuitos Mi..." ordered by date
 
   2005
International Paper Y. Lechuga, R. Mozuelos, M. Allende, M. Martínez, S. Bracho
"Fault detection in switched current circuits using built-in transient current sensors"
Journal of Electronic Testing-Theory and Applications 21 (6): 583-598. 2005-12
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International Paper R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"Test of a Switched Capacitor ADC by a Built-In Charge Sensor"
Microelectronics Journal 36 (12): 1064-1072. 2005-11
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International Conference Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Design for Test of High-Speed Folded ADCs"
XX Conference on Design of Circuits and Integrated Systems(DCIS 2005) Lisboa(P). 2005-11
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National Conference Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Test de Preamplificadores en Convertidores A/D Doblados"
Proc. of the XII Annual Seminar on Automatic Control, Industrial Electronics and Instrumentation (SAAEI 2005), Santander. 2005-09
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International Conference R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"Test of Averaged Preamplifiers in Folded ADCs "
11th IEEE International Mixed-Signals Testing Workshop (IMSTW 2005) Cannes(F). 2005-06
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   2004
International Conference R. Mozuelos, Y. Lechuga, M. Allende, M. Martínez, S. Bracho
"Experimental Evaluation of a Built-in Current Sensor for Analog Circuits"
XIX Conference on Design of Circuits and Integrated Systems (DCIS2004). Bordeaux (France). 2004-11
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International Conference Y. Lechuga, R. Mozuelos, M. Allende, M. Martínez, S. Bracho
"Experimental Analysis of Transient Current Test Based on dIDD Variations in S2I Memory Cells"
XIX Conference on Design of Circuits and Integrated Systems (DCIS2004). Bordeaux (France). 2004-11
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International Conference R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"Characterization of an SC ADC by a Built-In Charge Sensor"
10th International Mixed-Signal Testing Workshop (IMSTW2004). Portland (USA). 2004-06
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   2003
International Conference Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Dynamic Current Testing Strategies for S2I Algorithmic A/D Converters"
XVIII Conference on Design of Circuits and Integrated Systems (DCIS2003). Ciudad Real (Spain). 2003-11
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International Conference R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"SC Algorithmic ADC Test with a Built-In Charge Sensor"
XVIII Conference on Design of Circuits and Integrated Systems (DCIS2003). Ciudad Real (Spain). 2003-11
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International Conference Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Test generation in algorithmic switched current ADCs"
9th International Mixed-Signal Testing Workshop (IMSTW2003). Sevilla. 2003-06
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International Paper Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Built-In Sensor Based on Current Supply High-Frequency Behaviour"
Electronic Letters, Vol 39, No. 9. 2003-05
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International Conference Y. Lechuga, M. Martínez, S. Bracho
"Fault Detection in Algorithmic ADC Monitoring Charge in SC Converters and Dynamic Current in SI Converters"
IX Workshop IBERCHIP (IWS´2003). La Habana (Cuba). 2003-03
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   2002
International Conference Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Fault detection in algorithmic switched-current ADC using built-in sensors"
XVII Conference on Design of Circuits and Integrated Systems (DCIS 2002). Santander. 2002-11
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International Conference Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Built-in Dynamic Current Sensor for Hard-to-Detect Faults in Mixed-Signal ICs"
Design, Automation and Test in Europe, DATE 2002. Paris (France). 2002-03
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International Conference Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Hard-to-Detect Faults by Dynamic Current Sensor in Analogue Circuits"
3rd IEEE Latin-American Test Workshop, LATW2002. Montevideo (Uruguay). 2002-02
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