Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Signature Analysis in a Dynamic Current Test of Mixed-signals ICs
Type:International Conference
Where:International Mixed Signal Testing Workshop. Grenoble (F)
Date:1995-06
Authors: J. Argüelles
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
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