Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Hard-to-Detect Faults by Dynamic Current Sensor in Analogue Circuits
Type:International Conference
Where:3rd IEEE Latin-American Test Workshop, LATW2002. Montevideo (Uruguay)
Date:2002-02
Authors: Yolanda Lechuga
Román Mozuelos
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
Projects: Técnicas de Test para Circuitos Mixtos, Analógicos-Digitales. Aplicación ...
ISBN:
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Abstract:In switched analogue and continuous time circuits there are faults difficult to detect using test methods based on voltage or power supply current monitoring. However, it is possible to detect these faults if we include to the conventional dynamic power supply current test methods IDDT the analysis of the changes in the slope of this dynamic power supply current of the circuit under test.
In this work, a test method is presented based on the measurement of the transients appearing in the supply currents flowing in switched-current analogue circuits (SI). An extension of this technique to continuous-time analogue circuits is explored.
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