Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Fault detection in algorithmic switched-current ADC using built-in sensors
Type:International Conference
Where:XVII Conference on Design of Circuits and Integrated Systems (DCIS 2002). Santander
Date:2002-11
Authors: Yolanda Lechuga
Román Mozuelos
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
Projects: Técnicas de Test para Circuitos Mixtos, Analógicos-Digitales. Aplicación ...
ISBN:84-8102-311-6
PDF File:
Abstract:
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