Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Test generation in algorithmic switched current ADCs
Type:International Conference
Where:9th International Mixed-Signal Testing Workshop (IMSTW2003). Sevilla
Date:2003-06
Authors: Yolanda Lechuga
Román Mozuelos
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
Projects: Técnicas de Test para Circuitos Mixtos, Analógicos-Digitales. Aplicación ...
ISBN:
PDF File:
Abstract:
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