Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:SC Algorithmic ADC Test with a Built-In Charge Sensor
Type:International Conference
Where:XVIII Conference on Design of Circuits and Integrated Systems (DCIS2003). Ciudad Real (Spain)
Date:2003-11
Authors: Román Mozuelos
Yolanda Lechuga
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
Projects: Técnicas de Test para Circuitos Mixtos, Analógicos-Digitales. Aplicación ...
ISBN:84-87087-40-X
PDF File:
Abstract:This paper presents a test methodology for switched capacitor circuits (SC). The test approach utilizes a built-in sensor to analyze the charge transfer inside the circuit under test. The test methodology is applied to a 10-bit algorithmic analog to digital converter (ADC). In addition to the fault evaluation performed to verify the goodness of the test methodology, the charge sensor is used to characterize the linearity of the ADC.
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