| Full record |
|Title:||Test of a Switched Capacitor ADC by a Built-In Charge Sensor|
|Where:||Microelectronics Journal 36 (12): 1064-1072|
Test methods of digital and mixed integrated circuits
Técnicas de Test para Circuitos Mixtos, Analógicos-Digitales. Aplicación ...
|Abstract:||A test methodology for switched capacitor circuits is described. The test approach uses a built-in sensor to analyze the charge transfer inside the circuit under test (CUT). The test methodology is applied to a 10-bit algorithmic analog to digital converter to characterize the static linearity and to obtain the simulated fault coverage figures taking into account a catastrophic fault model. The goodness of the charge sensor has been experimentally evaluated with an SC integrator for fault detection and built-in sensor influence on the CUT performances.|