Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Test of Averaged Preamplifiers in Folded ADCs
Type:International Conference
Where:11th IEEE International Mixed-Signals Testing Workshop (IMSTW 2005) Cannes(F)
Authors: Román Mozuelos
Yolanda Lechuga
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
Projects: Técnicas de Test para Circuitos Mixtos, Analógicos-Digitales. Aplicación ...
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Abstract:This paper presents a design for test approach for
folded analog-to-digital converters. The test approach samples
the output voltages of several preamplifiers and buffers of the
ADC to detect a relative deviation among them when a fault is
injected. A fault simulation, taking into account catastrophic and
parametric faults, is done to check the test effectiveness.
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