Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
Home    Staff    Research    Teaching    Doctorate    Publications    Tools    versión en español Fri 14-Aug-20 . 13:42



Web Map


Location

News

Santander Info

GIM>Research>Publication
   PUBLICATION
 
   Full record
Title:Design for Test of High-Speed Folded ADCs
Type:International Conference
Where:XX Conference on Design of Circuits and Integrated Systems(DCIS 2005) Lisboa(P)
Date:2005-11
Authors: Yolanda Lechuga
Román Mozuelos
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
Projects: Técnicas de Test para Circuitos Mixtos, Analógicos-Digitales. Aplicación ...
ISBN:972-99387-2-5
PDF File:
Abstract:This paper presents a design for test approach for folding and interpolated analog-to-digital converters that incorporates a distributed track-and-hold preprocessing. The test approach samples the average voltage of the amplifier differential outputs. By comparing sequentially the sampled voltage of each amplifier with the one of a neighbour cell, the defects on the CUT can be detected. A fault evaluation is done to check the test effectiveness.
© Copyright GIM (TEISA-UC)    ¤    All rights reserved.    ¤    Legal TermsE-Mail Webmaster