Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:DfT Behavioural Description for Folded ADCs
Type:International Conference
Where:12th IEEE International Mixed-Signals Testing Workshop (IMSTW´06) Edinburgh(UK)
Date:2006-06
Authors: Román Mozuelos
Yolanda Lechuga
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
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