Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:A Method to calculate a Deterministic Test Pattern Generator based on Cellular Automata
Type:International Conference
Where:IEEE European Test Workshop, Montpellier (F)
Date:1996-06
Authors: M. J. López
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
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