Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Design for Test (DfT) study on a current mode DAC
Type:International Paper
Where:IEE Circuits, Devices and Systems. Volume 143, Number 6, pp 374-379
Date:1996-12
Authors: T. Olbrich
Román Mozuelos
A. Richardson
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
Projects:
ISBN:1350-2409
PDF File:
Abstract:
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