Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
Home    Staff    Research    Teaching    Doctorate    Publications    Tools    versión en español Thu 28-Mar-24 . 15:48



Web Map


Location

News

Santander Info

GIM>Research>Publication
   PUBLICATION
 
   Full record
Title:Dynamic Current Testing Methods in Mixed Signal Integrated Circuits
Type:International Conference
Where:Open Workshop AMATIST Project & Final Review Meeting. University of Twente (NL)
Date:1997-05
Authors: Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
Projects:
ISBN:
PDF File:
Abstract:
© Copyright GIM (TEISA-UC)    ¤    All rights reserved.    ¤    Legal TermsE-Mail Webmaster