Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Iddt testing of continuos-time filters
Type:International Conference
Where:13th VLSI Test Symposium. Princeton (USA)
Date:1995-04
Authors: J. Argüelles
M. J. López
J. Blanco
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
Projects:
ISBN:
PDF File:
Abstract:
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