Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Catastrophic and Parametric Fault Detection by Dinamic Power Supply Current Test
Type:International Conference
Where:IEE Colloquium on Testing Mixed Signal Circuits and Systems. London (England)
Date:1997-10
Authors: Salvador Bracho
Mar Martínez
R&D Lines: Test methods of digital and mixed integrated circuits
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