Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Catastrophic and Parametric Fault Detection By a Transient Current Test
Type:International Conference
Where:XIV Design of Circuits and Integrated Systems Conference.
Date:1999-11
Authors: Román Mozuelos
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
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ISBN:
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Abstract:
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