Grupo de Ingeniería Microelectrónica

Grupo de Ingeniería Microelectrónica

Departamento de Tecnología Electrónica, Ingeniería de Sistemas y Automática Universidad de Cantabria
Home   Personas   Investigación   Docencia   Doctorado   Publicaciones   Herramientas   Bolsa de Empleo   english version Sat 22-Jun-24 . 09:33

Mapa Web



Info Santander

Gestión BD

   Ficha completa
Título:Built-in Dynamic Current Sensor for Hard-to-Detect Faults in Mixed-Signal ICs
Tipo:Publicacion en Proceedings o Actas internacionales
Lugar:Design, Automation and Test in Europe, DATE 2002. Paris (France)
Autores: Yolanda Lechuga
Román Mozuelos
Mar Martínez
Salvador Bracho
Líneas: Métodos de test de circuitos integrados digitales y mixtos
Proyectos: Técnicas de Test para Circuitos Mixtos, Analógicos-Digitales. Aplicación ...
Resumen:There are some types of faults in analogue and mixed signal circuits which are very difficult to detect using either voltage or current based test methods. However, it is possible to detect these faults if we add to the conventional dynamic power supply current test methods IDDT, the analysis of the changes in the slope of this dynamic power supply current. In this work, we present a Built-In Current Sensor (BICS) which is able to process the highest frequency components in the dynamic power supply current of the circuit under test (CUT). The BICS uses an inductance made from a gyrator and a capacitor to carry out the current to voltage conversion. Moreover, the proposed test method improves the fault coverage in continuous circuits and switched current circuits as well
© Copyright GIM (TEISA-UC)    ¤    Todos los derechos Reservados.    ¤    Términos LegalesE-Mail Webmaster