Grupo de Ingeniería Microelectrónica

Grupo de Ingeniería Microelectrónica

Departamento de Tecnología Electrónica, Ingeniería de Sistemas y Automática Universidad de Cantabria
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Título:Behavioral model of folded and interpolated ADCs for test evaluation—Case study: Structural DfT method
Tipo:Articulo en revista internacional
Lugar:Microelectronics Journal, Volume 44, Issue 5, May 2013, Pages 382–392
Autores: Román Mozuelos
Yolanda Lechuga
Mar Martínez
Salvador Bracho
Líneas: Métodos de test de circuitos integrados digitales y mixtos
Proyectos: Diseño Testable de Sistemas Heterogéneos con Aplicación a Electrónica Méd...
Métodos de Test Funcionales y Estructurales: Aplicacion al Autotest de Ci...
Resumen:This paper presents a behavioral model for folded and interpolated analog-to-digital converters that takes into account non-idealities in the converter blocks. ADC performances are extracted by a Matlab/Simulink simulation to analyze how faults, considered as variations in the different parameters used for the description of each building block, affect the overall and local behaviors. This model also permits the evaluation of different test approaches (in an individual or comparative way). In this work we have developed a case study in which a structural Design-for-Test method has been preliminarily evaluated with good results. This methodology consists in sampling several internal points of the converter at the same time, so that, by computing relative variations among them, the presence of a defect can be detected.
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