Grupo de Ingeniería Microelectrónica

Grupo de Ingeniería Microelectrónica

Departamento de Tecnología Electrónica, Ingeniería de Sistemas y Automática Universidad de Cantabria
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   PUBLICACIONES en las que participa: "Román Mozuelos" ordenadas por fecha
 
   2013
Conferencia Internacional J. Miguel, Y. Lechuga, R. Mozuelos, M. Martínez
"Fault injection in an implantable MEMS-based pressure sensing device"
Proceedings of the 28th Design of Circuits and Integrated Systems Conference (DCIS 2013). 2013-11
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Conferencia Internacional J. Miguel, Y. Lechuga, R. Mozuelos, M. Martínez
"Fault Injection in an Implantable MEMS-Based Pressure Sensing Device"
Proceedings of 28th Design of Circuitos and Integrated Systems Conference DCIS 2013. 2013-11
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Revista Internacional R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"Behavioral model of folded and interpolated ADCs for test evaluation—Case study: Structural DfT method"
Microelectronics Journal, Volume 44, Issue 5, May 2013, Pages 382–392. 2013-05
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Conferencia Internacional J. Miguel, Y. Lechuga, R. Mozuelos, M. Martínez
"Implantable Sensor System for Remote Detection of a Restenosis Condition"
4th Doctoral Conference on Computing, Electrical and Industrial Systems (DoCEIS 2013). 2013-04
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Conferencia Internacional J. Miguel, Y. Lechuga, R. Mozuelos, M. Martínez
"Modeling of an implantable device for remote arterial pressure measurement"
SPIE Microtechnologies 2013. 2013-04
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   2012
Conferencia Internacional J. Miguel, R. Mozuelos, M. Martínez
"Modelling an implantable sensor system for restenosis monitorization in the pulmonary artery"
XXVII Conference on Design of Circuits and Integrated Systems (DCIS12) . 2012-11
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Conferencia Internacional J. Miguel, R. Mozuelos, M. Martínez
"Behavioural Analysis of an Implantable Flow and Pressure Sensing Device"
International Conference on Biomedical Electronics and Devices (Biodevices 2012). 2012-02
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   2011
Revista Internacional R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"Structural Test Approach for Embedded Analog Circuits based on a Built-In Current Sensor"
Journal of Electronic Testing (Springer). 2011-04
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Conferencia Internacional Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Design-for-Test Method for High-Speed ADCs: Behavioral Description and Optimization"
IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS´11), Cottbus (Germany) . 2011-04
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   2010
Conferencia Internacional Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Fault Evaluation of a Distributed Preamplifying Stage of a High-Speed Folded ADC"
XXV Conference on Design of Circuits and Integrated Systems, DCIS'10. 2010-11
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Conferencia Internacional R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"Test of Embedded Analog Circuits based on a Built-In Current Sensor"
European Test Symposium 2010, ETS10. 2010-05
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Capítulo de libro R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"Test based on Built-In Current Sensors for Mixed-Signal Circuits"
Emerging Trends in Technological Innovation, IFIP AICT 314, Springer. 2010-02
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Capítulo de libro Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Structural DfT Strategy for High-speed ADCs"
Emerging Trends in Technological Innovation, IFIP AICT 314, Springer*. 2010-02
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   2009
Tesis doctoral R. Mozuelos
"Test Basado en Sensores de Corriente Internos para Circuitos Integrados Mixtos (Analógicos-Digitales)"
Universidad de Cantabria. 2009-09
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Conferencia Internacional Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Optimization of a Structural DfT Targeting Fault Detection on High‐Speed ADCs"
European Test Symposium (ETS'09). Sevilla(E). 2009-05
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   2008
Conferencia Internacional Y. Lechuga, Ahcène Bounceur, R. Mozuelos, M. Martínez, S. Bracho, Salvador Mir
"Test Limit Evaluation for an ADC Structural Design-for-Test Approach by using a CAT Platform"
Proceedings of the Conference on Design of Circuits and Integrated Systems DCIS 2008, Grenoble (Francia). 2008-11
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Conferencia Internacional M. Martínez, M. Allende, R. Mozuelos, S. Bracho
"Microelectronics Distance Program with Extended Practical Work"
European Workshop on Microelectronics Education(EWME'2008). Budapest (Hungria). 2008-05
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   2007
Conferencia Internacional R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"Structural DfT Approach on Folded ADCs"
14th IEEE International Conference on Electronics, Circuits and Systems(ICECS'2007). Marrakech(Marruecos). 2007-12
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Conferencia Internacional R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"Behavioral Modeling for a Top-Down Design Methodology of Folded and Interpolated ADCs"
XXII Conference on Design of Circuits and Integrated Systems. Sevilla. 2007-11
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Conferencia Nacional M. Allende, R. Mozuelos, M. Martínez, S. Bracho
"Microelectronics interactive distance course with advanced experiments on MOS transistors in an on-line measurement laboratory"
Simposio Nacional de Tecnologías de la Información y las Comunicaciones en la Educación VIII Congreso Nacional de Informática Educativa [SINTICE 2007]. Zaragoza(E). 2007-09
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Conferencia Internacional R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"A Methodology for Structural Test of Folded ADCs"
International Mixed-signal Testing Workshop(IMSTW'07). Póvoa do Varzim(P). 2007-06
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   2006
Conferencia Internacional R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"Behavioral Model of Folded and Interpolated ADC using MathLab"
XXI Conference on Design of Circuits and Integrated Systems(DCIS 2006) Barcelona (E). 2006-11
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Conferencia Internacional M. Allende, R. Mozuelos, M. Martínez, S. Bracho
"Microelectronic Interactive Distance Course with On-line Measurement Laboratory"
3rd WSEAS International Conference on Engineering Education. Vouliaghmeni(Gr). 2006-07
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Conferencia Internacional R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"DfT Behavioural Description for Folded ADCs"
12th IEEE International Mixed-Signals Testing Workshop (IMSTW´06) Edinburgh(UK). 2006-06
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Revista Internacional M. Allende, R. Mozuelos, M. Martínez, S. Bracho
"Microelectronics Interactive Distance Course with Advanced Experiments on MOS Transistors in an On-line Measurement Laboratory"
WSEAS Transaction on Advances in Engineering Education, issue 5, Vol 3, 263-268. 2006-05
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   2005
Revista Internacional Y. Lechuga, R. Mozuelos, M. Allende, M. Martínez, S. Bracho
"Fault detection in switched current circuits using built-in transient current sensors"
Journal of Electronic Testing-Theory and Applications 21 (6): 583-598. 2005-12
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Revista Internacional R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"Test of a Switched Capacitor ADC by a Built-In Charge Sensor"
Microelectronics Journal 36 (12): 1064-1072. 2005-11
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Conferencia Internacional Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Design for Test of High-Speed Folded ADCs"
XX Conference on Design of Circuits and Integrated Systems(DCIS 2005) Lisboa(P). 2005-11
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Conferencia Nacional Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Test de Preamplificadores en Convertidores A/D Doblados"
Proc. of the XII Annual Seminar on Automatic Control, Industrial Electronics and Instrumentation (SAAEI 2005), Santander. 2005-09
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Conferencia Internacional R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"Test of Averaged Preamplifiers in Folded ADCs "
11th IEEE International Mixed-Signals Testing Workshop (IMSTW 2005) Cannes(F). 2005-06
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   2004
Conferencia Internacional R. Mozuelos, Y. Lechuga, M. Allende, M. Martínez, S. Bracho
"Experimental Evaluation of a Built-in Current Sensor for Analog Circuits"
XIX Conference on Design of Circuits and Integrated Systems (DCIS2004). Bordeaux (France). 2004-11
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Conferencia Internacional Y. Lechuga, R. Mozuelos, M. Allende, M. Martínez, S. Bracho
"Experimental Analysis of Transient Current Test Based on dIDD Variations in S2I Memory Cells"
XIX Conference on Design of Circuits and Integrated Systems (DCIS2004). Bordeaux (France). 2004-11
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Conferencia Internacional R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"Characterization of an SC ADC by a Built-In Charge Sensor"
10th International Mixed-Signal Testing Workshop (IMSTW2004). Portland (USA). 2004-06
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   2003
Conferencia Internacional Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Dynamic Current Testing Strategies for S2I Algorithmic A/D Converters"
XVIII Conference on Design of Circuits and Integrated Systems (DCIS2003). Ciudad Real (Spain). 2003-11
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Conferencia Internacional R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"SC Algorithmic ADC Test with a Built-In Charge Sensor"
XVIII Conference on Design of Circuits and Integrated Systems (DCIS2003). Ciudad Real (Spain). 2003-11
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Conferencia Internacional Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Test generation in algorithmic switched current ADCs"
9th International Mixed-Signal Testing Workshop (IMSTW2003). Sevilla. 2003-06
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Revista Internacional Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Built-In Sensor Based on Current Supply High-Frequency Behaviour"
Electronic Letters, Vol 39, No. 9. 2003-05
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   2002
Conferencia Internacional Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Fault detection in algorithmic switched-current ADC using built-in sensors"
XVII Conference on Design of Circuits and Integrated Systems (DCIS 2002). Santander. 2002-11
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Capítulo de libro M. Allende, R. Mozuelos, M. Martínez, S. Bracho
"Distance access to test equipment in an on-line IC test course"
Microelectronics Education, EWME 2002. Universidad de Vigo (España) Marcombo Boixareu Editores. 2002-05
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Conferencia Internacional Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Built-in Dynamic Current Sensor for Hard-to-Detect Faults in Mixed-Signal ICs"
Design, Automation and Test in Europe, DATE 2002. Paris (France). 2002-03
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Conferencia Nacional R. Mozuelos, M. Allende, M. Martínez, S. Bracho
"Laboratorio Remoto de Test: Caracterización de un Convertidor Analógico - Digital"
V Congreso de Tecnologías Aplicadas a la Enseñanza de la Electrónica (TAEE 2002). Las Palmas de Gran Canaria. 2002-02
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Conferencia Internacional Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Hard-to-Detect Faults by Dynamic Current Sensor in Analogue Circuits"
3rd IEEE Latin-American Test Workshop, LATW2002. Montevideo (Uruguay). 2002-02
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   2001
Conferencia Internacional R. Mozuelos, M. Martínez, S. Bracho
"Built-In Sensor Based on the Time-Variation of the Transient Current Supply in Analogue Circuits"
16th Design of Circuits and Integrated Systems Conference, DCIS 2001. Oporto (Portugal). 2001-11
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Conferencia Internacional M. Allende, R. Mozuelos, M. Martínez, S. Bracho
"On line IC test course with distance access to test equipment"
2nd IEEE Latin American Test Workshop. Cancún (Mexico). 2001-02
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   2000
Conferencia Internacional R. Mozuelos, M. Martínez, S. Bracho
"Test Laboratory"
1st Workshop of Test Network SetNet. Newcastle (UK). 2000-10
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   1999
Conferencia Internacional R. Mozuelos, M. Martínez, S. Bracho
"Catastrophic and Parametric Fault Detection By a Transient Current Test"
XIV Design of Circuits and Integrated Systems Conference.. 1999-11
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   1998
Conferencia Internacional R. Mozuelos, M. Martínez, S. Bracho
"Dynamic Power Supply Current Measurements for Catastrophic and Parametric Fault Detection"
4th International Mixed Signal Testing Workshop (IMSTW98). The Hague (The Netherlands). 1998-06
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Conferencia Internacional R. Mozuelos, M. Martínez, S. Bracho
"Sensor Performances in Dynamic Power Supply Current Test"
IEEE Hot Topic Workshop on Current Testing for Analogue and Mixed Signal Devices (CTAMS98). Paris (Francia). 1998-02
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   1996
Revista Internacional T. Olbrich, R. Mozuelos, A. Richardson, S. Bracho
"Design for Test (DfT) study on a current mode DAC"
IEE Circuits, Devices and Systems. Volume 143, Number 6, pp 374-379. 1996-12
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   1995
Conferencia Nacional R. Mozuelos, J. Argüelles, M. Martínez, S. Bracho
"Test basado en Iddt de un convertidor digital-analógico"
Congreso de Diseño de Circuitos Integrados y Sistemas (DCIS95). Zaragoza. 1995-11
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